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Eventi Metrologia Industriale
ZEISS Innovation Day: Surface Finish Metrology
Data
10/10/2018
Ubicazione
USA / Dayton, OH
Espositore
This informative session will cover how to deal with the R parameters pertaining to surface roughness, including averaging, Peak to Valley, Slope, Spacing, Counting and Bearing Area Curve. Industry expert, Mark C. Malburg, Ph.D. will lead this session.