Dear Customer,

due to the difficulties we all are facing on account of the Coronavirus situation, the FIB-SEM User Meeting Italy 2020 will be held online with three weekly sessions dedicated to specific topics. In each session we will have large room for round table discussions on the topics presented.

We invite you to join the Sessions that will take place on June 30th, on July 07th and 14th. You can choose to attend to just one or more sessions.

Program
Focused Ion Beam (FIB) combined with Field Emission Scanning Electron Microscope (FE-SEM) has become powerful instruments for numerous applications in research and industry. This technology is now the standard for cross-sectioning, nanoscale tomographic imaging and creation of new materials or functional structures with superior properties through etching, deposition and lithography. FIB-SEM applications are complex workflows that combine the capabilities of the FIB with other components like detectors, manipulators and gas injection systems (GIS).

The entire meeting will be held in English.

The virtual meetings are held with the support of CNR IMM – Institute of Microelectronics and Microsystems Section of Bologna.

Antonio Casares - Dr.

Antonio Casares is sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 20 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques.
Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree, summa cum laude, in “Charged Particle Optics”. Antonio was employed with the Max-Planck Institute as “Aerospace Instrument Scientist” and the Oak Ridge National Laboratory Nuclear Physics Division in the USA before he joined Carl Zeiss Strategic Business Development in August 2002.
 

Iwona Jóźwik - Ph.D.

Iwona Jóźwik is a specialist in scanning electron microscopy (SEM) and related techniques, i.e. EDS, EBSD, CL and also a specialist in sample preparation using focused ion beam (FIB) techniques. She obtained her master degree in Physics at the Faculty of Mathematics and Physics of the University of Maria Curie Skłodowska in Lublin, Poland (2001) and her PhD degree in Physics in 2006 by the decision of the Council of the Faculty of Applied Physics and Mathematics of the Gdańsk University of Technology, Gdańsk, Poland. Since 2008, she has been employed at the Institute of Electronic Materials Technology in Warsaw, and since 2017 also at the National Center for Nuclear Research, where she conducts research in the field of characterization of ion-irradiated damage in materials. Currently her research focuses on the application of low-energy scanning electron microscopy to direct visualization of the damage in semiconductors subjected to ion bombardment. She has published 60 scientific papers in the international journals with indexed IF. Her H-index is 11 (Web of Science) with more than 300 citations. She is currently a leading scientist/principal investigator of a project funded by Polish National Science Centre and is employed as an investigator in NOMATEN Centre of Excellence, an organization founded in the frames of Teaming for Excellence programme under Horizon 2020 financed by the European Commission.

Giulio Lamedica - Ph.D.

Head of Research Microscopy Solutions and Of Process Control Solutions at Carl Zeiss SpA.
PhD in Nanotechnology, over 20 years of experience in Microscopy and advanced imaging technologies.
Winner of Young Research Award at University of Rome La Sapienza, more than 30 publications on international Journals, co-author of 2 scientific books. Since 2016 he is leading the Research Microscopy Solutions and Process Control Solutions Business Units at Carl Zeiss SpA.
 

Vittorio Morandi – Ph.D.

Head of the Bologna Unit since September 2015, joined CNR-IMM Bologna in 1999. He graduated and obtained the PhD in Physics at University of Bologna in 2003 and his research activities concern the development of advanced electron microscopy characterization techniques, with a particular focus on SEM and STEM at low and at high energy, the structural characterization of nano-scale materials, in particular low-dimensional carbon allotropes, and synthesis, characterization and technological processing and integration of graphene and graphene-based materials. He authored more than 130 papers with more than 5000 citations and H-index 32 (source: Google Scholar). He is Coordinator of the Graphene Technology Group at IMM-BO, and member of the team of the Beyond Nano Electron Microscopy Lab (http://www.beyondnano.it), one of the largest facilities on Transmission Electron Microscopy in Italy. He is also the Coordinator of It-fab (http://itfab.bo.imm.cnr.it), the Italian network of research infrastructures in the field of nanofabrication, and Vice-Chair and member of the Steering Committee of EuroNanoLab (http://euronanolab.net). He is also Director of the newly established CNR-UNIBO Joint Laboratory on Electron Microscopy.

Fabián Pérez Willard - Dr.

Fabián Pérez Willard is Solutions Manager at ZEISS. His focus are microscopy solutions for the area of Nanoscience and Nanomaterials. Fabián studied physics at the Karlsruhe Institute of Technology (KIT), where he completed a PhD in low-temperature physics 2003.
After heading a multiuser service lab facility with focus on the fabrication and characterization of functional nanostructures at KIT, Fabián moved to ZEISS in 2006. At ZEISS he has held different positions in applications, product management and marketing. Fabián has 20+ years of experience in electron microscopy and is an expert in the field of ion microscopy.

Massimo Cuscunà - Ph.D.

Massimo Cuscunà is a Senior Technologist at the Institute of Nanotechnology (NANOTEC) of the National Research Council (CNR). He's Head of the clean room facility for Nanofabrication and his main Research Topics are Metamaterials, Plasmon Nanoparticles. His scientific activity focuses on the development and characterization of three-dimensional chiral metamaterials. These are a new class of metamaterials featured by the chiral geometry of the fundamental element, which interacts with light, generating phenomena such as circular dichroism or optical rotation dispersion to be leveraged for biosensing and nanophotonics applications. These materials exploit the principle of superchirality to amplify the chiro-optical response of intrinsically chiral biomolecules. The activity has led to the publication of high impact scientific papers in international journals related to the development and characterization of chiral nanosystems based on focused ion/electron beam induced deposition (FIBID/FEBID). Furthermore, my activity aims to produce and characterize novel plasmon nanoparticles through top-down physical technique such as electronic lithography (EBL). The purpose of this activity is the implementation of nanostructured metal plasmonic transducers using the localized plasma resonance (LSPR) technique.

Gian Carlo Gazzadi - Ph.D.

Gian Carlo Gazzadi is a senior technologist at the Nanoscience Institute of CNR in Modena, where he is responsible of the Nanofabrication Laboratory. His main fields of activity are the direct nanofabrication with focused ion and electron beams (dual beam FIB-SEM systems), using both ion milling and beam-induced deposition techniques, and FIB sample preparation for materials analysis. Scientific committee member of the FEBIP (Focused Electron Beam Induced Processing) International Workshop, he has chaired and organized the 7th event in Modena in 2018. He is a regular speaker at SISM (Società Italiana Scienze Microscopiche) national schools on FIB topics. He is author of 100 scientific publications on international journals.

Pasqualantonio Pingue - Ph.D.

Pasqualantonio Pingue is involved in the research activity in the field of the scanning probe microscopy (SPM), both imaging and nanolithography. Among his more recent research interests, there are also e beam and optical lithography nanofabrication techniques, new types of probes for scanning microscopy, confined polymer nanostructures studied trough dielectric and SPM-based techniques, synthesis of nanostructures and graphene-based devices.
Actually, his position is Chief Operating Officer (COO) at NEST Laboratory of Scuola Normale Superiore, where he has also the responsibility of the nanofabrication facility (clean room), the technical staff and safety and health in the nanotechnology research laboratories. He has also the role of vice-coordinator of the SNS unity of the national competence center on I4.0 technologies named ARTES4.0.

Matteo Ferroni - Ph.D.

Matteo Ferroni is presently associate professor in experimental physics at the University of Brescia and research associate at the Bologna unit of the IMM institute of the italian National Research Council (CNR).
His research activity concerns the characterization of materials by means of transmission and scanning electron microscopy, being electron tomography in the SEM the recent research interest.

Ria Mitchell - Dr.

Ria has just started a new position at The University of Sheffield (UK) as an Experimental Officer in X-ray micro CT and will be running their new Zeiss Xradia Versa 620. Prior to this, she was a Postdoctoral Research Associate in Correlative Imaging at Swansea University (UK) between 2017-2020, and a Postdoctoral Research Assistant at the Natural History Museum London (UK) between 2013-2016. Ria is a geologist by training and has interests in solving geological, biological and materials science research questions through application of novel tomography and microscopy techniques, particularly correlating X-ray CT/XRM, FIBSEM, OM, SEM, EBSD and SEM-EDS across dimensions and at a range of length scales.

Andreas Schertel - Ph.D.

Andreas Schertel works as staff scientist for FIB-SEM microscopy at ZEISS Microscopy Customer Center Europe in Oberkochen. Andreas graduated in Physics and received his PhD in Physical Chemistry at the University of Heidelberg. After working for a former manufacturer of Focused Ion Beam microscopes, he joined ZEISS in 2004. Andreas has more than 20 years of experience in the field of FIB-SEM microscopy and related applications. In the recent years he focused on life science applications especially using cryogenic techniques.