Virtual FIB-SEM User Meeting Italy 2020

ZEISS on Your Campus Program

Dear Customer,

due to the difficulties we all are facing on account of the Coronavirus situation, the FIB-SEM User Meeting Italy 2020 will be held online with three weekly sessions dedicated to specific topics. In each session we will have large room for round table discussions on the topics presented.

We invite you to join the Sessions that will take place on June 30th, on July 07th and 14th. You can choose to attend to just one or more sessions.

Program
Focused Ion Beam (FIB) combined with Field Emission Scanning Electron Microscope (FE-SEM) has become powerful instruments for numerous applications in research and industry. This technology is now the standard for cross-sectioning, nanoscale tomographic imaging and creation of new materials or functional structures with superior properties through etching, deposition and lithography. FIB-SEM applications are complex workflows that combine the capabilities of the FIB with other components like detectors, manipulators and gas injection systems (GIS).

The entire meeting will be held in English.

Choose your virtual workshop slot (one or more) and register in the form.

In cooperation with:

The virtual meetings are held with the support of CNR IMM – Institute of Microelectronics and Microsystems Section of Bologna.

Imaging and Sample Preparation Day

FIB-SEM allow to obtain morphological, compositional and analytical information from the surface, and cut cross-sections to image beneath the sample surface at the highest resolution. Moreover, this is the perfect tools to prepare specimens for other microscopic techniques such as TEM or STEM. 

Session 1 - Tuesday June 30th 2020

10.00 a.m. - 12.00 p.m. (CEST)

10.00

Welcome and presentation of the program

Vittorio Morandi (CNR-IMM)      Giulio Lamedica (ZEISS Microscopy)

10.10

Integrated TOF-SIMS in FIB-SEM: case studies

Antonio Casares (ZEISS Microscopy)

10.35

Virtual Round table TOF-SIMS and analytics

All

10.50

New perspectives in TEM Lamella preparation: case studies and practical example

Fabián Pérez Willard (ZEISS Microscopy)

11.10

Virtual round table TEM Lamella preparation

All

11.20

Low-kV scanning electron microscopy – beyond sample topography

Iwona Jóźwik (Łukasiewicz Institute of Electronic Materials Technology)

11.50

Virtual round table Low-kV imaging

All

12.00

End of the session

 

Thanks for joining our 1st session on June 30th

You can watch the recordings of the talks below

Introduction & Talk 1:

Integrated TOF-SIMS in FIB-SEM

Talk 2:

New perspectives in TEM Lamella preparation

Talk 3:

Low-kV scanning electron microscopy - beyond sample topography

Nanofabrication Day

Creation of nanostructures and nanodevices using a focused ion beam is widely used in materials research and electronics. It allows the creation of new functional materials or surfaces with superior optical, mechanical, electronic or magnetic properties. In this session we will explore these applications to highlight the future development and the constraints encountered in this field.

Session 2 - Tuesday 7th July

10:00 a.m.- 12.00 p.m. (CEST)

10.00

Focused Ion Beam (FIB) and Focused Electron Beam Induced Deposition (FEBID) for advanced nanocharacterization and nanofabrication

Giancarlo Gazzadi (CNR Istituto Nanoscienze)

10.25

Virtual round table FIBID and FEBID

All

10.40

3D chiral Metamaterials by Focused Ion/Electron Beam Induced Deposition

Massimo Cuscunà (CNR NANOTEC)

11.05

Virtual round table FIBID and FEBID (II)

All

11.20

FEG-SEM as a flexible and smart tool for R&D nanolithography

Pasqualantonio Pingue (NEST)

11.45

Virtual round table nanolithography

All

12.00

End of Session

 

Thanks for joining our 2nd session on July 7th

You can watch the recordings of the talks below

Introduction & Talk 1:

FIB and FEBID for advanced nanocharacterization and nanofabrication

Talk 2:

3D chiral Metamaterials by Focused Ion/Electron Beam Induced Deposition

Talk 3:

FEG-SEM as a flexible and smart tool for R&D nanolithography

3D Electron and Ion Microscopy Day

Tomography fully opens the third dimension to scanning electron microscopy. It allows to image and analyze not only a single plane, but a complete volume of a sample down to the nanometer scale.
In this session we will explore different nanotomography methods from Correlative 3D Imaging to FIB-SEM, Cryo FIB-SEM and STEM.

Session 3 - Tuesday July 14th

10.00 a.m. -12.00 p.m. (CEST)

10.00

Transmission imaging and tomography in the SEM platform

Matteo Ferroni (Università degli Studi di Brescia – CNR IMM)

10.25

Virtual round table STEM Tomography

All

10.40

Multi-scale correlative imaging: geological, biological and materials applications

Ria Mitchell (Faculty of Engineering, The University of Sheffield, UK)

11.05

Virtual round table Multi-scale Microscopy

All

11.20

Cryo Correlative Workflows from Confocal Microscopy to FIB-SEM

Andreas Schertel (ZEISS Microscopy)

11.45

Virtual round table Cryo Microscopy

All

12.00

End of session

 

Thanks for joining our 3rd session on July 14th

You can watch the recordings of the talks below

Introduction & Talk 1:

Transmission imaging and tomography in the SEM platform

Talk 2:

Multi-scale correlative imaging: geological, biological and materials applications

Speakers Profiles 1st Session (in alphabetical order)

Antonio Casares - Dr.

Antonio Casares is sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 20 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques.
Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree, summa cum laude, in “Charged Particle Optics”. Antonio was employed with the Max-Planck Institute as “Aerospace Instrument Scientist” and the Oak Ridge National Laboratory Nuclear Physics Division in the USA before he joined Carl Zeiss Strategic Business Development in August 2002.
 

Iwona Jóźwik - Ph.D.

Iwona Jóźwik is a specialist in scanning electron microscopy (SEM) and related techniques, i.e. EDS, EBSD, CL and also a specialist in sample preparation using focused ion beam (FIB) techniques. She obtained her master degree in Physics at the Faculty of Mathematics and Physics of the University of Maria Curie Skłodowska in Lublin, Poland (2001) and her PhD degree in Physics in 2006 by the decision of the Council of the Faculty of Applied Physics and Mathematics of the Gdańsk University of Technology, Gdańsk, Poland. Since 2008, she has been employed at the Institute of Electronic Materials Technology in Warsaw, and since 2017 also at the National Center for Nuclear Research, where she conducts research in the field of characterization of ion-irradiated damage in materials. Currently her research focuses on the application of low-energy scanning electron microscopy to direct visualization of the damage in semiconductors subjected to ion bombardment. She has published 60 scientific papers in the international journals with indexed IF. Her H-index is 11 (Web of Science) with more than 300 citations. She is currently a leading scientist/principal investigator of a project funded by Polish National Science Centre and is employed as an investigator in NOMATEN Centre of Excellence, an organization founded in the frames of Teaming for Excellence programme under Horizon 2020 financed by the European Commission.

Giulio Lamedica - Ph.D.

Head of Research Microscopy Solutions and Of Process Control Solutions at Carl Zeiss SpA.
PhD in Nanotechnology, over 20 years of experience in Microscopy and advanced imaging technologies.
Winner of Young Research Award at University of Rome La Sapienza, more than 30 publications on international Journals, co-author of 2 scientific books. Since 2016 he is leading the Research Microscopy Solutions and Process Control Solutions Business Units at Carl Zeiss SpA.
 

Vittorio Morandi – Ph.D.

Head of the Bologna Unit since September 2015, joined CNR-IMM Bologna in 1999. He graduated and obtained the PhD in Physics at University of Bologna in 2003 and his research activities concern the development of advanced electron microscopy characterization techniques, with a particular focus on SEM and STEM at low and at high energy, the structural characterization of nano-scale materials, in particular low-dimensional carbon allotropes, and synthesis, characterization and technological processing and integration of graphene and graphene-based materials. He authored more than 130 papers with more than 5000 citations and H-index 32 (source: Google Scholar). He is Coordinator of the Graphene Technology Group at IMM-BO, and member of the team of the Beyond Nano Electron Microscopy Lab (http://www.beyondnano.it), one of the largest facilities on Transmission Electron Microscopy in Italy. He is also the Coordinator of It-fab (http://itfab.bo.imm.cnr.it), the Italian network of research infrastructures in the field of nanofabrication, and Vice-Chair and member of the Steering Committee of EuroNanoLab (http://euronanolab.net). He is also Director of the newly established CNR-UNIBO Joint Laboratory on Electron Microscopy.

Fabián Pérez Willard - Dr.

Fabián Pérez Willard is Solutions Manager at ZEISS. His focus are microscopy solutions for the area of Nanoscience and Nanomaterials. Fabián studied physics at the Karlsruhe Institute of Technology (KIT), where he completed a PhD in low-temperature physics 2003.
After heading a multiuser service lab facility with focus on the fabrication and characterization of functional nanostructures at KIT, Fabián moved to ZEISS in 2006. At ZEISS he has held different positions in applications, product management and marketing. Fabián has 20+ years of experience in electron microscopy and is an expert in the field of ion microscopy.

Speakers Profiles 2nd Session (in alphabetical order)

Massimo Cuscunà - Ph.D.

Massimo Cuscunà is a Senior Technologist at the Institute of Nanotechnology (NANOTEC) of the National Research Council (CNR). He's Head of the clean room facility for Nanofabrication and his main Research Topics are Metamaterials, Plasmon Nanoparticles. His scientific activity focuses on the development and characterization of three-dimensional chiral metamaterials. These are a new class of metamaterials featured by the chiral geometry of the fundamental element, which interacts with light, generating phenomena such as circular dichroism or optical rotation dispersion to be leveraged for biosensing and nanophotonics applications. These materials exploit the principle of superchirality to amplify the chiro-optical response of intrinsically chiral biomolecules. The activity has led to the publication of high impact scientific papers in international journals related to the development and characterization of chiral nanosystems based on focused ion/electron beam induced deposition (FIBID/FEBID). Furthermore, my activity aims to produce and characterize novel plasmon nanoparticles through top-down physical technique such as electronic lithography (EBL). The purpose of this activity is the implementation of nanostructured metal plasmonic transducers using the localized plasma resonance (LSPR) technique.

Gian Carlo Gazzadi - Ph.D.

Gian Carlo Gazzadi is a senior technologist at the Nanoscience Institute of CNR in Modena, where he is responsible of the Nanofabrication Laboratory. His main fields of activity are the direct nanofabrication with focused ion and electron beams (dual beam FIB-SEM systems), using both ion milling and beam-induced deposition techniques, and FIB sample preparation for materials analysis. Scientific committee member of the FEBIP (Focused Electron Beam Induced Processing) International Workshop, he has chaired and organized the 7th event in Modena in 2018. He is a regular speaker at SISM (Società Italiana Scienze Microscopiche) national schools on FIB topics. He is author of 100 scientific publications on international journals.

 

Pasqualantonio Pingue - Ph.D.

Pasqualantonio Pingue is involved in the research activity in the field of the scanning probe microscopy (SPM), both imaging and nanolithography. Among his more recent research interests, there are also e beam and optical lithography nanofabrication techniques, new types of probes for scanning microscopy, confined polymer nanostructures studied trough dielectric and SPM-based techniques, synthesis of nanostructures and graphene-based devices.
Actually, his position is Chief Operating Officer (COO) at NEST Laboratory of Scuola Normale Superiore, where he has also the responsibility of the nanofabrication facility (clean room), the technical staff and safety and health in the nanotechnology research laboratories. He has also the role of vice-coordinator of the SNS unity of the national competence center on I4.0 technologies named ARTES4.0.

Speakers Profiles 3rd Session (in alphabetical order)

Matteo Ferroni - Ph.D.

Matteo Ferroni is presently associate professor in experimental physics at the University of Brescia and research associate at the Bologna unit of the IMM institute of the italian National Research Council (CNR).
His research activity concerns the characterization of materials by means of transmission and scanning electron microscopy, being electron tomography in the SEM the recent research interest.

Ria Mitchell - Dr.

Ria has just started a new position at The University of Sheffield (UK) as an Experimental Officer in X-ray micro CT and will be running their new Zeiss Xradia Versa 620. Prior to this, she was a Postdoctoral Research Associate in Correlative Imaging at Swansea University (UK) between 2017-2020, and a Postdoctoral Research Assistant at the Natural History Museum London (UK) between 2013-2016. Ria is a geologist by training and has interests in solving geological, biological and materials science research questions through application of novel tomography and microscopy techniques, particularly correlating X-ray CT/XRM, FIBSEM, OM, SEM, EBSD and SEM-EDS across dimensions and at a range of length scales.

 

Andreas Schertel - Ph.D.

Andreas Schertel works as staff scientist for FIB-SEM microscopy at ZEISS Microscopy Customer Center Europe in Oberkochen. Andreas graduated in Physics and received his PhD in Physical Chemistry at the University of Heidelberg. After working for a former manufacturer of Focused Ion Beam microscopes, he joined ZEISS in 2004. Andreas has more than 20 years of experience in the field of FIB-SEM microscopy and related applications. In the recent years he focused on life science applications especially using cryogenic techniques.

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